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This is post #8 of 8 in the series “DFT in ASIC” Design for test consideration in ASIC design...
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This is post #4 of 4 in the series “ARM and DFT JTAG” ARM and DFT JTAG discussion DFT...
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When we do IR drop analysis, we would like to use the worst case current. The next question is...
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Memory BIST is well known and widely used to test on-chip memories. However, Mbist does not use function path....
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This is post #3 of 3 in the series “some DFT topics” some DFT topics Recently our chip burn-in...
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DFT normally consists of LBIST, MBIST, and some supporting logic. LBIST is to test combinational and flip-flops based on...
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Mbist is employed to conduct memory test on tester. Below diagram is a generic structure of how memory BIST...
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This is post #3 of 4 in the series “ARM and DFT JTAG” ARM and DFT JTAG discussion Let’s...
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This is post #6 of 8 in the series “DFT in ASIC” Design for test consideration in ASIC design...
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Scan chain based design for test (DFT) methodology has been widely adopted in chip industry. In test mode, we...
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This is post #5 of 8 in the series “DFT in ASIC” Design for test consideration in ASIC design...
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This is post #4 of 8 in the series “DFT in ASIC” Design for test consideration in ASIC design...
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This is post #3 of 8 in the series “DFT in ASIC” Design for test consideration in ASIC design...
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This is post #2 of 3 in the series “some DFT topics” some DFT topics SoC normally has on-chip...
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One big problem between frondend team and backend team is miscommunication. For example, to cut down power consumption, frondend team comes up...
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This is post #2 of 8 in the series “DFT in ASIC” Design for test consideration in ASIC design...
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This is post #1 of 8 in the series “DFT in ASIC” Design for test consideration in ASIC design...
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This is post #1 of 3 in the series “some DFT topics” some DFT topics Here we use Synopsys...
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