IEEE VLSI Test Symposium (VTS)

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IEEE VLSI Test Symposium (VTS)

25 April 2016

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Date(s) - 04/25/2016 - 04/27/2016
All Day

Caesars Palace


The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems.


– Analog/Mixed-Signal/RF Test
– ATPG & Compression
– ATE Architecture & Software
– Automotive Test & Safety
– Built-In Self-Test (BIST)
– Defect & Current Based Test
– Defect/Fault Tolerance
– Delay & Performance Test
– Design for Testability (DFT)
– Design Verification/Validation
– Embedded System & Board Test
– Embedded Test Methods
– Emerging Technologies Test
– FPGA Test
– Fault Modeling and Simulation
– Hardware Security
– Low-Power IC Test
– Microsystems/MEMS/Sensors Test
– Memory Test and Repair
– On-Line Test & Error Correction
– Power/Thermal Issues in Test
– System-on-Chip (SOC) Test
– Test Standards
– Test Economics
– Test of Biomedical Devices
– Test of High-Speed I/O
– Test Quality and Reliability
– Test Resource Partitioning
– Transients and Soft Errors
– 2.5D, 3D and SiP Test

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