Case study: how DFT output dedicated isolation cell causes issue in Burn-In test

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Case study: how DFT output dedicated isolation cell causes issue in Burn-In test

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| | 4.5 4.5/5 (2 ) 2 | 300+

Recently our chip burn-in failed. After 400 hours some analog block is broken. Further debugging shows it is due to below dft output isolation cell.

 

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2 Comments
  1. chieuluu 1 year ago
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    Goood

    5
  2. chieuluu 1 year ago
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    Good

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